Navegação Microeletrônica por Assunto "Efeitos de radiação"

Resultados 1-1 de 1

    • Circuit-level design impact on variability and soft errors robustness 

      Brendler, Leonardo Heitich (2020) [Dissertação]
      Physical limitations were found in MOSFET devices with the advancement in microelectronics. To overcome these limitations, multigate devices, such as the FinFET technology, were introduced, allowing the continuity of the ...