Survey on reliability estimation in digital circuits
dc.contributor.author | Pontes, Matheus F. | pt_BR |
dc.contributor.author | Farias, Clayton | pt_BR |
dc.contributor.author | Schvittz, Rafael Budim | pt_BR |
dc.contributor.author | Butzen, Paulo Francisco | pt_BR |
dc.contributor.author | Rosa Junior, Leomar Soares da | pt_BR |
dc.date.accessioned | 2022-06-22T05:03:33Z | pt_BR |
dc.date.issued | 2021 | pt_BR |
dc.identifier.issn | 1807-1953 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/10183/240651 | pt_BR |
dc.description.abstract | The aggressive technology scaling has signifi-cantly affected the circuit reliability. The interaction of envi-ronmental radiation with the devices in the integrated circuits(ICs) may be the dominant reliability aspect of advanced ICs. Several techniques have been explored to mitigate the radia-tion effects and guarantee a satisfactory reliability levels. Inthis context, estimating circuit radiation reliability is crucialand a challenge that has not yet been overcome. For decades,several different methods have been proposed to provide cir-cuit reliability. Recently, the radiation effects have been morefaithfully incorporated in these strategies to provide the cir-cuit susceptibility more accurately. This paper overviews thecurrent trend for estimating the radiation reliability of digi-tal circuits. The survey divides the approaches into two ab-straction levels: (i) gate-level that incorporate the layout infor-mation and (ii) circuit-level that traditionally explore the logiccircuit characteristic to provide the radiation susceptibility ofcombinational circuits. We also present an open-source toolthat incorporates several previously explored methods. Finally,the actual research aspects are discussed, providing the newlyemerging topic, such as selective hardening and critical vector identification. | en |
dc.format.mimetype | application/pdf | pt_BR |
dc.language.iso | eng | pt_BR |
dc.relation.ispartof | Journal of integrated circuits and systems. Porto Alegre, RS. Vol. 16, no. 3 (2021), p. 1-11 | pt_BR |
dc.rights | Open Access | en |
dc.subject | Reliability | en |
dc.subject | Circuitos digitais | pt_BR |
dc.subject | Fault tolerance | en |
dc.subject | Exposição à radiação | pt_BR |
dc.subject | Radiation susceptibility | en |
dc.subject | Digital circuits | en |
dc.title | Survey on reliability estimation in digital circuits | pt_BR |
dc.type | Artigo de periódico | pt_BR |
dc.identifier.nrb | 001141546 | pt_BR |
dc.type.origin | Nacional | pt_BR |
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